发明名称 ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
摘要 A lens adjustment method and a lens adjustment system which adjust a plurality of multi-pole lenses of an electron spectrometer attached to a transmission electron microscope, optimum conditions of the multi-pole lenses are determined through simulation based on a parameter design method using exciting currents of the multi-pole lenses as parameters.
申请公布号 US2011095182(A1) 申请公布日期 2011.04.28
申请号 US20110985708 申请日期 2011.01.06
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 TERADA SHOHEI;TANIGUCHI YOSHIHUMI;KAJI KAZUTOSHI
分类号 G01N23/00 主分类号 G01N23/00
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