发明名称 Integrated circuit with low-power built-in self-test logic
摘要 An integrated circuit with low-power built-in self-test logic (“IC-LPBIST”) is disclosed. The IC-LPBIST may include combinational logic and a loading circuit enabled to load a shift test pattern of data into the loading circuit without powering the combinational logic of the IC-LPBIST, wherein the shift test pattern of data is configured to test the combinational logic for logical faults.
申请公布号 US7895491(B2) 申请公布日期 2011.02.22
申请号 US20060418588 申请日期 2006.05.04
申请人 BROADCOM CORP. 发明人 WONG YUQIAN C.
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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