发明名称 Selection device for re-writable memory
摘要 A memory cell including a memory element and a non-ohmic device (NOD) that are electrically in series with each other is disclosed. The NOD comprises a semiconductor based selection device operative to electrically isolate the memory element from a range of voltages applied across the memory cell that are not read voltages operative read stored data from the memory element or write voltages operative to write data to the memory element. The selection device may comprise a pair of diodes that are electrically in series with each other and disposed in a back-to-back configuration. The memory cell may be fabricated over a substrate (e.g., a silicon wafer) that includes active circuitry. The selection device and the semiconductor materials (e.g., poly-silicon) that form the selection device are fabricated above the substrate and are integrated with other thin film layers of material that form the memory cell.
申请公布号 US7884349(B2) 申请公布日期 2011.02.08
申请号 US20080283339 申请日期 2008.09.11
申请人 UNITY SEMICONDUCTOR CORPORATION 发明人 RINERSON DARRELL;HSIA STEVE KUO-REN;LONGCOR STEVEN W.;KINNEY WAYNE;WARD EDMOND;CHEVALLIER CHRISTOPHE J.
分类号 H01L29/06;G11C11/56;G11C13/00;H01L21/8246;H01L27/10;H01L27/115;H01L27/24;H01L45/00 主分类号 H01L29/06
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