发明名称 Method for fabricating a charge trapping memory device
摘要 A method for fabricating a charge trapping memory device includes providing a substrate; forming a first oxide layer on the substrate; forming a number of BD regions in the substrate; nitridizing the interface of the first oxide layer and the substrate via a process; forming a charge trapping layer on the first oxide layer; and forming a second oxide layer on the charge trapping layer.
申请公布号 US7863132(B2) 申请公布日期 2011.01.04
申请号 US20060425160 申请日期 2006.06.20
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 SHIH YEN-HAO;LU CHI-PIN;HSIEH JUNG-YU
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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