发明名称 THICKNESS DETECTING MECHANISM
摘要 A thickness detecting mechanism is provided for detecting a thickness of a to-be-measured article. The thickness detecting mechanism includes a detecting arm and an optical displacement sensing module. The detecting arm is moved as the to-be-measured article is sustained against the detecting arm. The detecting arm includes a surface. The optical displacement sensing module detects the surface of the detecting arm when the detecting arm is respectively located in a first position and a second position. According to the displacement amount of the detecting arm from the first position to the second position, the thickness of the to-be-measured article is acquired.
申请公布号 US2010328683(A1) 申请公布日期 2010.12.30
申请号 US20090560202 申请日期 2009.09.15
申请人 PRIMAX ELECTRONICS LTD. 发明人 PAN YUNG-TAI
分类号 G01B11/06;G01B11/14 主分类号 G01B11/06
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