发明名称 METHOD AND APPARATUS FOR MEASURING SURFACE PROFILE OF SAMPLE
摘要 A method for measuring surface profile of a sample, wherein jumping of a probe can be constrained without applying strong force to the sample, and an apparatus employing such a method. Control operation consists of detection of displacement in a probe in the vertical direction on the top surface of a sample being measured by means of a sensor, calculation of velocity and acceleration of the probe in accordance with detection of the displacement in the probe, detection of jumping of the probe through real-time monitoring of at least either velocity or acceleration of the probe, and a control of the current delivered to a stylus pressure generator for the probe. Such a control operation is performed in a small amount of time, and a stylus pressure applied to the probe is increased only while the probe is in the air, while the stylus pressure applied to the probe is returned to an original pressure before the probe touches the sample again.
申请公布号 US2010288033(A1) 申请公布日期 2010.11.18
申请号 US20080668705 申请日期 2008.07.11
申请人 MIZUTANI NAOKI 发明人 MIZUTANI NAOKI
分类号 G01B5/28;G05B13/02 主分类号 G01B5/28
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