发明名称 MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE
摘要 Methods for multiple level program verify, memory devices, and memory systems are disclosed. In one such method, a series of programming pulses are applied to a memory cell to be programmed. A program verify pulse, at an initial program verify voltage, is applied to the memory cell after each programming pulse. The initial program verify voltage is a verify voltage that has been increased by a quick charge loss voltage. The quick charge loss voltage is subtracted from the initial program verify voltage after either a programming pulse has reached a certain reference voltage or a quantity of programming pulses has reached a pulse count threshold.
申请公布号 US2010284219(A1) 申请公布日期 2010.11.11
申请号 US20090436955 申请日期 2009.05.07
申请人 MICRON TECHNOLOGY, INC. 发明人 KIM TAEHOON;HE DEPING;KESSENICH JEFFREY ALAN
分类号 G11C16/02;G11C7/00;G11C16/06 主分类号 G11C16/02
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