发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to obtain the high reliability and the high performance by depositing a cobalt-based capping layer on a copper-based conductive layer through an electro-less plating method. CONSTITUTION: A first insulating layer is formed on a semiconductor substrate(100). A groove is formed by selectively etching the first insulating layer. A copper-based conductive layer(400) fills the groove. A cobalt-based capping layer is deposited on the copper-based conductive layer through an electro-less plating method. The first insulating layer and the cobalt-based capping layer are washed using a first basic washing solution.
申请公布号 KR20100110123(A) 申请公布日期 2010.10.12
申请号 KR20090028537 申请日期 2009.04.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YOUNG SEOK;YUN, JONG HO;MOON, KWANG JIN;CHOI, GIL HEYUN;LEE, JONG MYEONG;CHOI ZUNG SUN;JUNG, HYE KYUNG
分类号 H01L21/28 主分类号 H01L21/28
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