发明名称 |
PHASE CHANGE MATERIAL BASED TEMPERATURE SENSOR |
摘要 |
A block of phase change material located in a semiconductor chip is reset to an amorphous state. The block of phase change material may be connected to an internal resistance measurement circuit that can transmit the measured resistance data to input/output pads either in an analog output format or in a digital output format. Depending on the ambient temperature, the resistance of the block of phase change material changes. By measuring a fractional resistance change compared to the resistance of the phase change material at a calibration temperature, the temperature of the region around the phase change material can be accurately measured. A logic decoder and an input/output circuit may be employed between the internal resistance measurement circuit and the input/output pads. A plurality of temperature sensing circuits containing phase change material blocks may be employed in the semiconductor chip to enable an accurate temperature profiling during chip operation.
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申请公布号 |
US2010254425(A1) |
申请公布日期 |
2010.10.07 |
申请号 |
US20100819721 |
申请日期 |
2010.06.21 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HABIB NAZMUL;LAM CHUNG HON;MCMAHON ROBERT |
分类号 |
G01N25/02 |
主分类号 |
G01N25/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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