| 摘要 |
PROBLEM TO BE SOLVED: To effectively utilize WRITE operation to a test of a self-refresh mode by enabling WRITE operation even during self-refresh of a semiconductor memory device. SOLUTION: The semiconductor memory device having a self-refresh function is provided with a circuit means in which data write-in operation for a memory cell can be performed during self-refresh. Thereby, during self-refresh, it can be tested whether a self-refresh period is within the standard or not by performing write-in of data for a memory cell on a row address decided by a refresh counter in a state in which write-in of data for the memory cell can be performed by the circuit means. COPYRIGHT: (C)2011,JPO&INPIT
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