发明名称 GALLIUM NITRIDE-BASED HIGH ELECTRON MOBILITY TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To set a forward voltage V<SB>f</SB>to a large positive value by restraining a variation of a threshold voltage value V<SB>th</SB>, and to increase saturation output power P<SB>sat</SB>. Ž<P>SOLUTION: An epitaxial growth substrate is formed by forming a buffer layer 112, a channel layer 114, a carrier supply layer 116 and a cap layer 118 one by one in a crystalline substrate 110 by an epitaxial growth method. A GaN-based HEMT is constituted by forming a source electrode 122, a gate electrode 124 and a drain electrode 126 in the epitaxial growth substrate. The thickness t<SB>1</SB>of the cap layer is formed at least thicker than 11 nm. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010206125(A) 申请公布日期 2010.09.16
申请号 JP20090052989 申请日期 2009.03.06
申请人 OKI ELECTRIC IND CO LTD 发明人 OKI HIDEYUKI;HOSHI SHINICHI
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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