| 摘要 |
A device and a method for evaluating ESD protection capabilities of an integrated circuit, the method includes: connecting multiple test probe to multiple integrated circuit testing points. The method is characterized by repeating the stages of: (i) charging a discharge capacitor to an ESD protection circuit triggering voltage level; (ii) connecting the discharge capacitor to the integrated circuit during a testing period such as to cause the discharge capacitor to interact with the integrated circuit; (iii) measuring at least one signal of the integrated circuit, during at least a portion of the testing period; and (iv) determining at least one ESD protection characteristic of the integrated circuit in response to the at least one signal.
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