发明名称 Testing System and Testing Method
摘要 The invention discloses a testing system and a testing method. The testing system includes a testing platform and a fetching device. The testing platform includes a metal base plate, a DUT board, a testing stand and a metal wall. The DUT board is disposed on the metal base plate. The testing stand is disposed on the DUT board. The metal wall is disposed on the metal base plate and surrounds the testing stand. The fetching device is movably disposed above the testing platform and used for placing a DUT on the testing stand. A metal covering plate of the fetching device corresponds to the metal wall of the testing platform. When the fetching device places the DUT on the testing stand, the metal covering plate cooperates with the metal wall and the metal base plate of the testing platform to form an isolated space, so as to isolate the DUT.
申请公布号 US2010207638(A1) 申请公布日期 2010.08.19
申请号 US20090609064 申请日期 2009.10.30
申请人 QUANTA COMPUTER, INC. 发明人 NIEN KUO-CHIANG;SHEN LI-CHENG;HSU CHIN-LIEN;HSIEH TSUNG-YING
分类号 G01R31/02 主分类号 G01R31/02
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