| 摘要 |
PURPOSE: A semiconductor device including a test pattern is provided to improve the reliability of a test pattern for a drain contact plug by decreasing resistance. CONSTITUTION: A first active region, a second active region and a third active region are respectively formed on an even region and an odd region and are electrically isolated. A contact plug(104) is formed on the upper side of the second active region. A metal wiring(106) is formed on the upper side of the contact plug. The second active regions formed on the even region and the odd region make a pair and are electrically connected to each other.
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