发明名称 FLAME-FREE WET OXIDATION
摘要 PROBLEM TO BE SOLVED: To provide a flame-free wet oxidation of a semiconductor wafer. SOLUTION: Water for use in wet oxidation of semiconductor surfaces may be generated by reacting ultrapure hydrogen and ultrapure oxygen without generating a flame. Since no flame is used, contamination problem due to a flame impinging on quartz components of a "torch" is not caused. Flame-free generation of water is accomplished by reacting hydrogen and oxygen under conditions that do not result in ignition. This may be accomplished by providing a diluted hydrogen stream in which molecular hydrogen is mixed with a diluent such as a noble gas or nitrogen. This use of diluted hydrogen also reduces or eliminates the danger of explosion. This can simplify the apparatus design by eliminating the need for complicated interlocks, flame detectors, etc. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010171442(A) 申请公布日期 2010.08.05
申请号 JP20100061336 申请日期 2010.03.17
申请人 LSI CORP 发明人 RAJIBU PATERU
分类号 H01L21/316;C01B5/00;C23C8/16;H01L29/78 主分类号 H01L21/316
代理机构 代理人
主权项
地址