发明名称 SEMICONDUCTOR EMBEDDED RESISTOR GENERATION
摘要 A method for generating an embedded resistor in a semiconductor device and related computer-readable storage medium are provided, the method and program steps of the medium including forming a shallow trench isolation (STI) region in a substrate; forming a pad oxide on the STI region and substrate; depositing a silicon layer on the pad oxide; forming a photo-resist mask on a portion of the silicon layer disposed substantially above the STI region.; etching the silicon layer to yield a polyconductor (PC) disposed substantially above the STI region; oxidizing the PC; depositing at least one of an oxide material or a metal gate material on the oxidized surface; depositing a silicon layer on the at least one oxide material or metal gate material; depositing additional silicon on a portion of the silicon layer disposed substantially above the STI region; patterning a transistor gate with a photo-resist mask disposed on another portion of the silicon layer disposed substantially away from the STI region; and etching the silicon layer to yield at least one transistor structure disposed substantially away from the STI region and at least one resistor structure disposed substantially above the STI region.
申请公布号 US2010197106(A1) 申请公布日期 2010.08.05
申请号 US20090364764 申请日期 2009.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION;CHARTERED SEMICONDUCTOR MANUFACTURING LTD.;FREESCALE SEMICONDUCTOR;INFINEON NORTH 发明人 RYOU CHOONGRYUL;LEE SEUNGHWAN;YUAN JUN;CHAN VICTOR;ELLER MANFRED;KIM NAM SUNG;KANIKE NARASIMHULU;SAMAVEDAM SRIKANTH BALAJI
分类号 H01L21/76;G06F17/50 主分类号 H01L21/76
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