发明名称 |
System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices |
摘要 |
A system and method for testing an integrated circuit module including multiple integrated circuit devices that provide a data strobe signal associated with at least one data signal provided by the same integrated circuit device. A determination of a test outcome for the integrated circuit module may be made after identifying data valid windows for each integrated circuit device, without having to both identify a common sampling window defined by an intersection of the identified data valid windows and verify that such common sampling window meets specification requirements.
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申请公布号 |
US7757144(B2) |
申请公布日期 |
2010.07.13 |
申请号 |
US20070933796 |
申请日期 |
2007.11.01 |
申请人 |
KINGTIGER TECHNOLOGY (CANADA) INC. |
发明人 |
LAI BOSCO CHUN SANG;CHANG SUNNY LAI-MING;SONG CHARLIE;CHU KEVIN |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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