发明名称 |
III-NITRIDE SEMICONDUCTOR GROWTH SUBSTRATE, III-NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE, III-NITRIDE SEMICONDUCTOR ELEMENT, III-NITRIDE SEMICONDUCTOR FREESTANDING SUBSTRATE, AND METHOD FOR FABRICATING THESE |
摘要 |
<p>Disclosed are a III-nitride semiconductor epitaxial substrate, a III-nitride semiconductor element, and a III-nitride semiconductor freestanding substrate, which have good crystallinity, not only with AlGaN, GaN, or GaInN, the growth temperature of which is at or below 1050°C, but also with AlxGa1-xN, the growth temperature of which is high and which has a high Al composition, a III-nitride semiconductor growth substrate for fabricating these, and a method to efficiently fabricate these, which is characterized by being equipped with a crystal growth substrate, at least the surface portion of which is made from a III-nitride semiconductor containing Al, and a single metallic layer that is made from Zr or Hf and is formed on the aforementioned surface portion.</p> |
申请公布号 |
WO2010074346(A1) |
申请公布日期 |
2010.07.01 |
申请号 |
WO2009JP71903 |
申请日期 |
2009.12.25 |
申请人 |
DOWA HOLDINGS CO., LTD.;DOWA ELECTRONICS MATERIALS CO., LTD.;TOBA, RYUICHI;MIYASHITA, MASAHITO;TOYOTA, TATSUNORI |
发明人 |
TOBA, RYUICHI;MIYASHITA, MASAHITO;TOYOTA, TATSUNORI |
分类号 |
H01L21/20;C30B29/38;H01L21/205 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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