发明名称 III-NITRIDE SEMICONDUCTOR GROWTH SUBSTRATE, III-NITRIDE SEMICONDUCTOR EPITAXIAL SUBSTRATE, III-NITRIDE SEMICONDUCTOR ELEMENT, III-NITRIDE SEMICONDUCTOR FREESTANDING SUBSTRATE, AND METHOD FOR FABRICATING THESE
摘要 <p>Disclosed are a III-nitride semiconductor epitaxial substrate, a III-nitride semiconductor element, and a III-nitride semiconductor freestanding substrate, which have good crystallinity, not only with AlGaN, GaN, or GaInN, the growth temperature of which is at or below 1050°C, but also with AlxGa1-xN, the growth temperature of which is high and which has a high Al composition, a III-nitride semiconductor growth substrate for fabricating these, and a method to efficiently fabricate these, which is characterized by being equipped with a crystal growth substrate, at least the surface portion of which is made from a III-nitride semiconductor containing Al, and a single metallic layer that is made from Zr or Hf and is formed on the aforementioned surface portion.</p>
申请公布号 WO2010074346(A1) 申请公布日期 2010.07.01
申请号 WO2009JP71903 申请日期 2009.12.25
申请人 DOWA HOLDINGS CO., LTD.;DOWA ELECTRONICS MATERIALS CO., LTD.;TOBA, RYUICHI;MIYASHITA, MASAHITO;TOYOTA, TATSUNORI 发明人 TOBA, RYUICHI;MIYASHITA, MASAHITO;TOYOTA, TATSUNORI
分类号 H01L21/20;C30B29/38;H01L21/205 主分类号 H01L21/20
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