发明名称 TEST INTERFACE DEVICE, TEST SYSTEM AND OPTICAL INTERFACE MEMORY DEVICE
摘要 PURPOSE: A test interface device, a test system, and an optical interface memory device are provided to reduce the use of an optical resource using serialization and paralleling technology. CONSTITUTION: A first serializing unit(131) receives a parallel test signal from an automatic test device and serializes a parallel test signal into a serial test signal. A first optical transmitter(133) receives a serial test signal from the first serializing unit, converts the serial test signal into an optical test signal, and transmits the optical test signal. A first optical receiver(134) receives the optical test signal and converts the optical test signal into the serial test signal. A first paralleling unit receives the serial test signal from the first optical receiver, converts the serial test signal into the parallel test signal, and transmits the parallel test signal to a test target device.
申请公布号 KR20100067487(A) 申请公布日期 2010.06.21
申请号 KR20080126070 申请日期 2008.12.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG HOON;BYUN, EUN JO;WOO, CHEOL JONG;OH, SE JANG
分类号 G01R31/26 主分类号 G01R31/26
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