发明名称 |
TEST INTERFACE DEVICE, TEST SYSTEM AND OPTICAL INTERFACE MEMORY DEVICE |
摘要 |
PURPOSE: A test interface device, a test system, and an optical interface memory device are provided to reduce the use of an optical resource using serialization and paralleling technology. CONSTITUTION: A first serializing unit(131) receives a parallel test signal from an automatic test device and serializes a parallel test signal into a serial test signal. A first optical transmitter(133) receives a serial test signal from the first serializing unit, converts the serial test signal into an optical test signal, and transmits the optical test signal. A first optical receiver(134) receives the optical test signal and converts the optical test signal into the serial test signal. A first paralleling unit receives the serial test signal from the first optical receiver, converts the serial test signal into the parallel test signal, and transmits the parallel test signal to a test target device.
|
申请公布号 |
KR20100067487(A) |
申请公布日期 |
2010.06.21 |
申请号 |
KR20080126070 |
申请日期 |
2008.12.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG HOON;BYUN, EUN JO;WOO, CHEOL JONG;OH, SE JANG |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|