METHOD FOR SELF-TESTING AND SELF-REPAIRING ON CHIP

摘要

A method for self-testing and self-repairing on chip is disclosed, the method comprises two stages. In the first stage, a self-test unit tests units under test and transfers test results to a self-repair unit, and corresponding multiplexers or bypass switches are controlled by the self-repair unit to replace faulty units under test with backup units based on the test results. In the second stage, the self-test unit retests the repaired units under test.