发明名称 Substrate treating apparatus and semiconductor device manufacturing method
摘要 A gas flow in a load-lock type preliminary chamber is improved. A load-lock type substrate treating apparatus contains a processing chamber (34) for storing and processing a substrate (1); a preliminary chamber (23) continuously arranged to the processing chamber (31); a substrate holding jig mechanism (40) for carrying in and carrying out a substrate holding jig (50) holding multiple substrates (1), to and from the processing chamber (31); an inert gas supply port (61) for supplying inert gas to the preliminary chamber (23); a first exhaust port (71) provided above the inert gas supply port (61) in the preliminary chamber (23) to exhaust the inert gas: a second exhaust port (81) to draw a vacuum in the preliminary chamber (23); and a controller (100) for performing control so that the inert gas supplied from the inert gas supply port (61) is exhausted only from the first exhaust port (71), while maintaining the preliminary chamber (23) drawn a vacuum from the second exhaust port (81) at a specified pressure after raising the pressure.
申请公布号 US7731797(B2) 申请公布日期 2010.06.08
申请号 US20050665217 申请日期 2005.10.26
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 NAKASHIMA SEIYO;TANIYAMA TOMOSHI;SUZAKI KENICHI;TAKASHIMA YOSHIKAZU
分类号 C23C16/00;H01L21/00 主分类号 C23C16/00
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