发明名称 |
Test access control for secure integrated circuits |
摘要 |
Test access to an integrated circuit 2 is controlled by the use of test access enabling keys. A plurality of different test access enabling levels may be supported corresponding to different keys. The test access control may be performed by dedicated hardware or software executing a secure privilege mode.
|
申请公布号 |
US7730545(B2) |
申请公布日期 |
2010.06.01 |
申请号 |
US20050134514 |
申请日期 |
2005.05.23 |
申请人 |
ARM LIMITED |
发明人 |
MILNE GEORGE JAMES;SWAINE ANDREW BROOKFIELD;FELTON DONALD |
分类号 |
G06F7/04;G06F11/00 |
主分类号 |
G06F7/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|