发明名称 |
Device under test pogo pin type contact element |
摘要 |
A device under test pogo pin type contactor features an active head and an electronic component associated with the active head. A tip is spaced from the active head and a biasing device is between the active head and the tip for biasing the active head against a device under test.
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申请公布号 |
US7728613(B2) |
申请公布日期 |
2010.06.01 |
申请号 |
US20070975043 |
申请日期 |
2007.10.17 |
申请人 |
ANALOG DEVICES, INC. |
发明人 |
BLANEY GERARD;GRUBB JOHN;NOLAN NIALL |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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