| 摘要 |
PURPOSE: A test socket having columnar particle is provided, which forms an adjacent conductive particle on the pillar, diminishes whole electrical resistance by increasing contact area with an adjacent conductive particle. CONSTITUTION: The upper end of conductive part(20) comes into contact with an electrode of the tested device. The bottom of the conductive part comes into contact with a pad of the test apparatus. Between the upper and lower ends, conductive particles(21) are aligned within an elastic material(22) in the upward and downward directions. An insulating/supporting part(30) insulates the conductive part. The insulation support part supports the conductive part. The conductive particle is a column-type particle of a pillar type. A post is expanded in one direction.
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