发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device is provided with improved reliability. A semiconductor chip is mounted over a chip mounting portion of a lead frame via solder. A metal plate is arranged over a source pad of the semiconductor chip and a lead portion of a lead frame via solder. A solder reflow process is performed thereby to bond the semiconductor chip over the chip mounting portion with a solder, and to bond the metal plate to the source pad and the lead portion with the other solders. The lead frame is formed of a copper alloy, and thus has its softening temperature higher than the temperature of the solder reflow process. The metal plate is formed of oxygen-free copper, and has its softening temperature lower than the temperature of the solder reflow process, whereby the metal plate is softened in the solder reflow process. Thereafter, a gate pad electrode of the semiconductor chip is coupled to a lead portion via the wire, a sealing resin portion is formed, and then the lead frame is cut.
申请公布号 US2010123240(A1) 申请公布日期 2010.05.20
申请号 US20090619561 申请日期 2009.11.16
申请人 RENESAS TECHNOLOGY CORP. 发明人 SATO YUKIHIRO;FUNATSU KATSUHIKO;NAKAMURA HIROYUKI
分类号 H01L23/48;H01L21/50;H01L21/60 主分类号 H01L23/48
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