发明名称 METHOD AND APPARATUS FOR DERIVING PARAMETERS OF OPTICAL PATHS IN OPTICAL NETWORKS USING A TWO-WAVELENGTH OTDR AND A WAVELENGTH-DEPENDENT REFLECTIVE ELEMENT
摘要 A method of distinguishing a wavelength-dependent reflective element (HRD) from wavelength-independent events in an optical network, the reflective element (HRD) being highly-reflective at a first predetermined wavelength (?1) and significantly less reflective at at least one other predetermined wavelength (?2), comprising the steps of: connecting the wavelength-dependent reflective element (HRD) to said optical path at a first position, and, using an optical time domain reflectometer (22) connected to said optical path at a position remote from said reflective element, launching into said optical path light at said first wavelength (?1) and at said second wavelength (?2), detecting corresponding backreflected light from said optical paths and obtaining therefrom first and second OTDR traces (OTDR-?1,OTDR-?2) corresponding to said first (?1) and second (?2) wavelengths, respectively, of detected backreflected light as a function of optical distance from said point; comparing the first and second OTDR traces to distinguish a peak corresponding to said wavelength-dependent reflective element from peaks corresponding to said wavelength-independent reflective events; and outputting at least one parameter value of the distinguished peak as a measure of a parameter of said wavelength-dependent reflective element.
申请公布号 CA2737974(A1) 申请公布日期 2010.04.22
申请号 CA20092737974 申请日期 2009.10.19
申请人 EXFO INC. 发明人 PERRON, STEPHANE
分类号 H04B10/08;H04B10/20 主分类号 H04B10/08
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