发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 It is an object of the present invention to provide a thin film transistor in which an oxide semiconductor film containing indium (In), gallium (Ga), and zinc (Zn) is used and contact resistance of a source or a drain electrode layer is reduced, and a manufacturing method thereof. An IGZO layer is provided over the source electrode layer and the drain electrode layer, and source and drain regions having lower oxygen concentration than the IGZO semiconductor layer are intentionally provided between the source and drain electrode layers and the gate insulating layer, so that ohmic contact is made.
申请公布号 US2010065842(A1) 申请公布日期 2010.03.18
申请号 US20090556590 申请日期 2009.09.10
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;AKIMOTO KENGO;KOMORI SHIGEKI;UOCHI HIDEKI
分类号 H01L29/786;H01L21/336;H01L29/12 主分类号 H01L29/786
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