发明名称 Lithographic process using a nanowire mask, and nanoscale devices fabricated using the process
摘要 The disclosure pertains to a method for making a nanoscale filed effect transistor structure on a semiconductor substrate. The method comprises disposing a mask on a semiconductor upper layer of a multi-layer substrate, and removing areas of the upper layer not covered by the mask in a nanowire lithography process. The mask includes two conductive terminals separated by a distance, and a nanowire in contact with the conductive terminals across the distance. The nanowire lithography may be carried out using a deep-reactive-ion-etching, which results in an integration of the nanowire mask and the underlying semiconductor layer to form a nanoscale semiconductor channel for the field effect transistor.
申请公布号 US2010025658(A1) 申请公布日期 2010.02.04
申请号 US20080221068 申请日期 2008.07.29
申请人 COLLI ALAN 发明人 COLLI ALAN
分类号 H01L29/06;H01L21/336 主分类号 H01L29/06
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