发明名称 MONITORING A PROCESS SECTOR IN A PRODUCTION FACILITY
摘要 Monitoring a process sector in a production facility includes establishing a tool defect index associated with a process sector in the production facility. The tool defect index includes a signal representing a defect factor associated with a tool in the process sector. Monitoring the process also requires determining whether the defect factor is a known defect factor or an unknown defect factor, and analyzing a unit from the tool if the defect factor is an unknown defect factor. Monitoring the process further requires identifying at least one defect on the unit from the tool, establishing that the at least one defect is a significant defect, determining cause of the significant defect, and creating an alert indicating that the tool associated with the process sector is producing units having significant defects.
申请公布号 US2010017010(A1) 申请公布日期 2010.01.21
申请号 US20080175018 申请日期 2008.07.17
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 COTE WILLIAM;GUSE MICHAEL;LAGUS MARK E.;RICE JAMES;SONG YUNSHENG
分类号 G06F19/00 主分类号 G06F19/00
代理机构 代理人
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