发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method and a manufacturing apparatus of a semiconductor wafer capable of resolving a trouble occurring when both of the front and rear are specular surfaces, while securing required planarity. <P>SOLUTION: The method of a semiconductor wafer includes: surface grinding processing (process S15) for grinding only the surface of a wafer of which etching is completed prior to polishing the wafer; and primary polishing processing (process S17) for simultaneously polishing the front and the rear of the wafer by non-abrasive particles which are abrasive, to set the front and rear of the wafer to be a specular surface and a fogging state, respectively. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010010621(A) 申请公布日期 2010.01.14
申请号 JP20080171386 申请日期 2008.06.30
申请人 SUMCO CORP 发明人 TANIGUCHI TORU;SAKAI TAKASHI
分类号 H01L21/304;B24B37/00;B24B37/08 主分类号 H01L21/304
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