发明名称 PROBE CARD WITH STRUCTURE FOR COMPENSATING HEAT-DISTORTION AND
摘要 PURPOSE: A probe card with structure for compensating heat-distortion is provided to reduce the thermal strain of the space transformer. CONSTITUTION: The probe card(10) comprises the substrate(11). The substrate (plate) is corresponded to the space transformer. Substrate has conduction hole(113). Conduction holes are arranged between the front side (front surface) and back side of substrate. In this case, conduction holes pass through substrate.
申请公布号 KR20100000264(A) 申请公布日期 2010.01.06
申请号 KR20080059695 申请日期 2008.06.24
申请人 TSC MEMSYS CO., LTD. 发明人 LEE, OUG KI
分类号 H01L21/66;G01R1/073 主分类号 H01L21/66
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