TECHNIQUES FOR PERFORMING A LOGIC BUILT-IN SELF-TEST IN AN INTEGRATED CIRCUIT DEVICE

摘要

A method, system and computer program product for performing device characterization Logic Built-In Self-Test (LBIST) in an IC device. Test parameters of the LBIST are saved in a memory of the IC device, and nominal operational parameters of the IC device are used to define a signature of the LBIST. A determination whether the LBIST is passed or failed is made within the characterized IC device.