发明名称 SAMPLING APPARATUS, SAMPLING METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a sampling apparatus capable of sampling a high bandwidth signal. SOLUTION: The sampling apparatus for sampling a signal under measurement includes a clock control section generating two or more sampling clocks at two or more irregular spacing sampling phases defined so as to negate replicas, in a sampling band, which are not observation targets within the replicas of the signal under measurement and the replicas of the negative frequency component of the signal under measurement, in every sampling operation repetition period, and a sampling section sampling the signal under measurement according to each of two or more sampling clocks. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009300437(A) 申请公布日期 2009.12.24
申请号 JP20090129601 申请日期 2009.05.28
申请人 ADVANTEST CORP 发明人 KAWABATA MASAYUKI;AKITA TAKAYUKI;KANO EIJI
分类号 G01R13/34;G01R31/28 主分类号 G01R13/34
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