| 摘要 |
An apparatus for characterizing an operating parameter in an integrated circuit, in accordance with one embodiment of the present invention, includes a voltage potential module, a plurality of distribution systems and a plurality of ring oscillator modules. Each ring oscillator module is coupled to the voltage potential module by a respective distribution system. Each ring oscillator module generates an oscillator signal as a function of the voltage potential and a voltage drop caused by the respective distribution system. The characterization of the operating parameter may be extrapolated from the difference in the operating frequencies of the ring oscillator modules.
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