IN-SITU JITTER TOLERANCE TESTING FOR SERIAL INPUT OUTPUT

摘要

According to some embodiments, a method and apparatus are provided to generate a sine wave via a jitter modulator to modulate a control voltage of a clock source. The jitter modulator is in-situ on a die. The sine wave is received at a clock and data recovery circuit comprising the clock source. The clock and data recovery circuit is in-situ on the die.