发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To pass a cell source line and a cell well line within a cell array region so as to reduce resistance of the cell source line and the cell well line, in a word line direction, and capable of passing also a power supply line in a bit line direction. <P>SOLUTION: A nonvolatile semiconductor memory device includes a cell array including a memory string arranged in a matrix shape, a bit line connected to the memory string, a first wire connected to a cell source line of a memory cell, a second wire connected to a cell well line of a memory cell, a third wire which supplies a power supply voltage to a circuit arranged outside of a region of the cell array, a fourth wire and a fifth wire arranged along a forming direction of a bit line. The first wire, the second wire and the third wire are formed in a layer above a layer in which the bit line within the cell array region is formed, the fourth wire and the fifth wire are formed in a layer in which the bit line is formed, the first wire and the fourth wire are connected, and the second wire and the fifth wire are connected. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2009283665(A) 申请公布日期 2009.12.03
申请号 JP20080134093 申请日期 2008.05.22
申请人 TOSHIBA CORP 发明人 ABE TAKUMI
分类号 H01L21/8247;G11C16/04;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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