| 摘要 |
PURPOSE: A socket for Kelvin testing is provided to a Kelvin test by combining a pair of probes with a horizontal combining unit and a vertical combining unit. CONSTITUTION: A socket body(200) is installed at a test circuit board(5), and a pair of coupling holes(210a,210b) that vertically penetrate the socket body are vertically arranged in a vertical coupling unit. A pair of coupling holes that vertically penetrate the socket body are horizontally at the horizontal coupling unit. On the upper parts of a pair of probes(100a,100b), a probe unit(12) contacting an inspection target solder ball(4) is formed. The pair of the probes are combined with the pair of the coupling holes of the horizontal and vertical coupling units.
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