| 摘要 |
PURPOSE: A contactor for testing an electronic component is provided to form a through hole in the center of a conductive body and form at least two grooves radially in the through hole to certainly vacuum-inject conductive silicon into each hole, thereby improving product quality, workability and productivity. CONSTITUTION: Insulating silicon is in a middle part of a base(11). A plurality of holes which is arranged at a fixed interval in at least two rows is punched in the insulation silicon. A ball lead of a semiconductor device of a BGA type contacts a hole(21) of insulting silicon(20) in conductive silicon(30). A conductive body(33) is integrated by insert-injection in each hole of insulating silicon. A through hole is formed in the center for vacuum injection to a hole of the insulating silicon. At least two grooves are radially formed in the through hole.
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