发明名称 |
A SAMPLER PICKER FOR HOT METAL PROBE |
摘要 |
PURPOSE: A sampling device for a hot metal probe is provided to improve analysis success yield by providing disk sample facilitating automated analysis. CONSTITUTION: A sampling device for a hot metal probe comprises a shell block, a sample collecting hole, and a temperature sensor. The shell block(100) is inserted into a housing protecting duct forming a probe and a part of the outer surface of the shell block is opened. The sample collecting hole(200) is built in the shell block and is made of a ceramic case and a cooling plate. The temperature sensor is eccentrically installed at the bottom surface of the shell block. The temperature sensor is protected by a sensor protective cap(112). |
申请公布号 |
KR20090103244(A) |
申请公布日期 |
2009.10.01 |
申请号 |
KR20080028729 |
申请日期 |
2008.03.28 |
申请人 |
WOOJIN ELECTRO-NITE INC. |
发明人 |
LEE, MAN EOB;HWANG, SEON CHUN;KIM, HYO SANG;YOO, JIN TAE;LEE, GYU HONG |
分类号 |
G01N1/02;G01N1/00;G01N1/10 |
主分类号 |
G01N1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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