发明名称 A SAMPLER PICKER FOR HOT METAL PROBE
摘要 PURPOSE: A sampling device for a hot metal probe is provided to improve analysis success yield by providing disk sample facilitating automated analysis. CONSTITUTION: A sampling device for a hot metal probe comprises a shell block, a sample collecting hole, and a temperature sensor. The shell block(100) is inserted into a housing protecting duct forming a probe and a part of the outer surface of the shell block is opened. The sample collecting hole(200) is built in the shell block and is made of a ceramic case and a cooling plate. The temperature sensor is eccentrically installed at the bottom surface of the shell block. The temperature sensor is protected by a sensor protective cap(112).
申请公布号 KR20090103244(A) 申请公布日期 2009.10.01
申请号 KR20080028729 申请日期 2008.03.28
申请人 WOOJIN ELECTRO-NITE INC. 发明人 LEE, MAN EOB;HWANG, SEON CHUN;KIM, HYO SANG;YOO, JIN TAE;LEE, GYU HONG
分类号 G01N1/02;G01N1/00;G01N1/10 主分类号 G01N1/02
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