发明名称 ELECTRON BEAM DETECTOR, SCANNING TYPE ELECTRON MICROSCOPE, MASS SPECTROMETER, AND ION DETECTOR
摘要 In an electron beam detector, a light guide optically couples a fluorescence emitting surface of the compound semiconductor substrate to a light incident surface of the photodetector, and physically connects the compound semiconductor substrate with the photodetector, thereby integrating the compound semiconductor substrate with the photodetector. When the compound semiconductor substrate converts incident electrons to fluorescent light, the light guide guides the fluorescent light to the photodetector, and the photodetector detects the fluorescent light, thereby detecting the incident electrons. <IMAGE>
申请公布号 KR100917387(B1) 申请公布日期 2009.09.17
申请号 KR20037009043 申请日期 2002.01.30
申请人 发明人
分类号 H01J37/244 主分类号 H01J37/244
代理机构 代理人
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