发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for manufacturing a semiconductor apparatus which enable secure cleaning of a nozzle that do not allow a resist adhering and fixing to the front end or the vicinity of a resist delivery nozzle or the vicinity of the front end of the nozzle interior to peel off upon resist delivery to prevent quality fault when the semiconductor apparatus is manufactured. SOLUTION: A cleaning means (cleaning nozzle 101) is provided for a resist applying means (resist delivery nozzle 104) that applies resist to the semiconductor apparatus when the semiconductor apparatus is manufactured. Cleaning by the cleaning means is carried out by performing cleaning with a solvent (solvent from a first tube 102), and then performing drying with a gas (gas from a second tube 103) from a direction opposite to a resist delivery direction (direction of resist delivery by the resist delivery nozzle 104). COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009194020(A) 申请公布日期 2009.08.27
申请号 JP20080030599 申请日期 2008.02.12
申请人 PANASONIC CORP 发明人 MAEKAWA YASUO
分类号 H01L21/027;B05C11/10;B05D3/10 主分类号 H01L21/027
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