MULTI-SOURCE SENSOR FOR THREE-DIMENSIONAL IMAGING USING PHASED STRUCTURED LIGHT

摘要

A system (100) for sensing a three-dimensional topology of a test surface (122) is provided. A first illumination source (104) generates first patterned illumination (112) from a first point of view. A second illumination source (106) generates second patterned illumination (114) from a second point of view, the second point of view differing from the first point of view. An area array image detector (108) simultaneously acquires at least first and second fringe images relative to the first and second patterned illuminations (112, 114). A controller (102) is coupled to the first and second sources (104, 106) and to the detector (108). The controller (102) generates a height topology of the test surface (122) based on images acquired while the first and second patterned illuminators (104, 106) are energized.