发明名称 Metal line of semiconductor device and forming method thereof
摘要 A method of fabricating a semiconductor device comprising forming a metal layer on a semiconductor substrate, patterning the metal layer to form a plurality of metal wires having side surfaces, forming spacers on both side surfaces of each of the metal wires, and forming an insulating layer between the spacers of the adjacent metal wires, the insulating layer having voids formed therein and being formed with material having a dielectric constant which differs from that of the spacers, and a semiconductor device made by this method.
申请公布号 KR100905828(B1) 申请公布日期 2009.07.02
申请号 KR20070094131 申请日期 2007.09.17
申请人 发明人
分类号 H01L21/28;H01L21/283 主分类号 H01L21/28
代理机构 代理人
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