发明名称 METHOD FOR FORMING TRENCHES WITH WIDE UPPER PORTION AND NARROW LOWER PORTION
摘要 <p>A method for forming a semiconductor structure includes the following steps. A hard mask layer is formed over a semiconductor region. The hard mask layer has inner portions that are thinner than its outer portions, and the inner portions define an exposed surface area of the semiconductor region. A portion of the semiconductor region is removed through the exposed surface area of the semiconductor region. The thinner portions of the hard mask layer are removed to expose surface areas of the semiconductor region underlying the thinner portions. An additional portion of the semiconductor region is removed through all exposed surface areas of the semiconductor region thereby forming a trench having an upper portion that is wider than its lower portion.</p>
申请公布号 WO2009079306(A1) 申请公布日期 2009.06.25
申请号 WO2008US86273 申请日期 2008.12.10
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION;CHEN, HUI;HO, IHSIU;HALL, STACY W.;HARWARD, BRIANT;PARAVI, HOSSEIN 发明人 CHEN, HUI;HO, IHSIU;HALL, STACY W.;HARWARD, BRIANT;PARAVI, HOSSEIN
分类号 H01L21/762;H01L27/092 主分类号 H01L21/762
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