发明名称 Positive resist composition and pattern forming method using the same
摘要 A positive resist composition, which comprises: (A) a resin having a monocyclic or polycyclic alicyclic hydrocarbon structure, of which solubility in an alkali developer increases under an action of an acid; (B) a compound capable of generating an acid upon irradiation with actinic rays or radiation; (C) a resin having a repeating unit represented by formula (C) as defined in the specification; and (D) a solvent, wherein a content of the resin as the component (C) is from 0.1 to 20 mass % based on a solid content of the positive resist composition, and a pattern forming method using the same.
申请公布号 US7550250(B2) 申请公布日期 2009.06.23
申请号 US20060645780 申请日期 2006.12.27
申请人 FUJIFILM CORPORATION 发明人 KANDA HIROMI
分类号 G03F7/00;G03F7/004 主分类号 G03F7/00
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