发明名称 Memory device and method for operating the same
摘要 A memory device and method for operating the same are provided. The example method may be directed to a method of performing a memory operation on a memory device, and may include applying a negative voltage bias to the memory device during a programming operation of the memory device and applying a positive voltage bias to the memory device during an erasing operation of the memory device. The example memory device may include a substrate and a gate structure formed on the substrate, the gate structure exhibiting a faster flat band voltage shift under a negative voltage bias than under a positive voltage bias, the gate structure receiving a negative voltage bias during a programming of the memory device and receiving a positive voltage bias during an erasing operation of the memory device.
申请公布号 US7542346(B2) 申请公布日期 2009.06.02
申请号 US20070704204 申请日期 2007.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK SANG-JIN;PARK YOUNG-SOO;SHIN SANG-MIN;CHA YOUNG-KWAN
分类号 G11C16/04 主分类号 G11C16/04
代理机构 代理人
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