发明名称 Structure monitor system
摘要 A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.
申请公布号 US7542856(B2) 申请公布日期 2009.06.02
申请号 US20030562922 申请日期 2003.07.02
申请人 NEUBREX CO., LTD. 发明人 KISHIDA KINZO;NAKANO MOTOHIRO;YAMAUCHI YOSHIAKI
分类号 G01B5/30;G01B11/16;G01D5/353;G01M11/08 主分类号 G01B5/30
代理机构 代理人
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