发明名称 Semiconductor device including ESD protective element
摘要 A semiconductor device includes a plurality of gate electrodes, source and drain regions, a plurality of source contacts, a plurality of drain contacts, substrate contacts, and a salicide block. The gate electrodes are arrayed in parallel on a semiconductor region on a semiconductor substrate. The source and drain regions are formed in the semiconductor region on both sides of each gate electrode. The source contacts are formed on the source region. The drain contacts are formed on the drain region. The substrate contacts are formed on the semiconductor substrate and electrically connect to the semiconductor substrate. The salicide block is formed between the gate electrode and the plurality of drain contacts. The salicide block prevents silicidation on the drain region. The length of the salicide block in a channel length direction increases as the distance from the substrate contact increases.
申请公布号 US7528449(B2) 申请公布日期 2009.05.05
申请号 US20060581744 申请日期 2006.10.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SUTOU CHIE;KAWASHIMA HIROBUMI
分类号 H01L23/62 主分类号 H01L23/62
代理机构 代理人
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