| 摘要 |
PROBLEM TO BE SOLVED: To provide an eddy current inspection probe and an eddy current inspection apparatus capable of exactly obtaining properties such as of a defect. SOLUTION: The eddy current inspection probe 3 includes a pair of exciting coils 1A and 1B arranged symmetrically and radially separately from each other so that the axial direction is substantially perpendicular to the inspection surface of an analyte 4, and a detection sensor 2 that is arranged between these exciting coils 1A and 1B and detects variation of eddy current induced in the analyte 4 by the exciting coils 1A and 1B. The detection sensor 2 is arranged while being positionally shifted from the symmetry axis P between the exciting coils 1A and 1B. COPYRIGHT: (C)2009,JPO&INPIT
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