SEMICONDUCTOR DEVICE WITH ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT AND METHOD OF TESTING THE SAME

摘要

A semiconductor device and a method for testing the same are provided to reduce a size of a chip by reducing the number of test pad and the number of electrostatic discharge protection circuit. A test circuit(140) outputs a test control signal and a selection control signal in response to a test enable signal. An inner circuit(120) outputs a plurality of test signals by performing a fixed operation in response to the test control signal. A selection signal generating part(150) outputs a selection signal in response to the selection control signal. At least one multiplexer(160) receives a plurality of test signals, selects one among a plurality of test signals in response to the selection signal, and outputs the selection test signal. At least one test pad(TP) corresponds to at least one multiplexer, and receives the selection test signal. At least one electrostatic discharge protection circuit(110) is positioned between the multiplexer and the test pad, and discharges static electricity supplied through the test pad.